中華人民共和國國家標準(中國大陸GB標準)英文版 |
GB標準是中華人民共和國國家標準,也叫GB國標,是中國大陸強制執行的國家標準,所有中國大陸境內銷售的商品及提供服務都必須符合GB國家標準的要求,包括進口商品及服務; 本網站提供GB國家標準的查詢檢索,英文版翻譯,GB標準產品檢測檢驗及合規性分析服務; |
GB/T 42789-2023 硅片表面光泽度的测试方法(中英文版) Test method for silicon wafer surface gloss |
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GB/T 43493.2-2023 半导体器件 功率器件用碳化硅同质外延片缺陷的无损检测识别判据 第2部分:缺陷的光学检测方法(中英文版) Semiconductor devices - Non-destructive testing and identification criteria for defects in silicon carbide homoepitaxial wafers for power devices - Part 2: Optical detection methods for defects |
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GB/T 1558-2023 硅中代位碳含量的红外吸收测试方法(中英文版) Infrared absorption test method for substituted carbon content in silicon |
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GB/T 43493.3-2023 半导体器件 功率器件用碳化硅同质外延片缺陷的无损检测识别判据 第3部分:缺陷的光致发光检测方法(中英文版) Semiconductor devices - Non-destructive testing and identification criteria for defects in silicon carbide homoepitaxial wafers for power devices - Part 3: Photoluminescence detection method of defects |
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GB/T 41605-2022 滚动轴承球用氮化硅材料 室温压痕断裂阻力试验方法 压痕法(中英文版) Silicon nitride materials for rolling bearing balls - Test method for indentation fracture resistance at room temperature - Indentation method |
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GB/T 41490-2022 氮化硅陶瓷 室温下滚动接触疲劳试验方法 球板法(中英文版) Test method for rolling contact fatigue of silicon nitride ceramics at room temperature ball plate method |
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GB/T 32280-2022 硅片翘曲度和弯曲度的测试? 自动非接触扫描法(中英文版) Test method for warp and bow of silicon wafers—Automated non-contact scanning method |
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GB/T 24581-2022 硅单晶中III、V族杂质含量的测定 低温傅立叶变换红外光谱法(中英文版) Test method for Ⅲ and Ⅴ impurities content in single crystal silicon—Low temperature FT-IR analysis method |
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GB/T 41737-2022 铝基复合材料 碳化硅体积分数试验方法 溶解法(中英文版) Aluminum matrix composites - Test method for volume fraction of silicon carbide - Dissolution method |
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GB/T 41765-2022 碳化硅单晶位错密度的测试方法(中英文版) Test method for dislocation density of silicon carbide single crystal |
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GB/T 40279-2021 硅片表面薄膜厚度的测试 光学反射法(中英文版) Test method for thickness of films on silicon wafer surface—Optical reflection method |
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GB/T 1551-2021 硅单晶电阻率的测定 直排四探针法和直流两探针法(中英文版) Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method |
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GB/T 14146-2021 硅外延层载流子浓度的测试 电容-电压法(中英文版) Test method for carrier concentration of silicon epitaxial layers - Capacitance-voltage method |
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JC/T 2599-2021 建筑装饰用弹性地板挥发性有机化合物(voc)释放试验方法(中英文版) Test method for the release of volatile organic compounds (voc) from resilient floors for architectural decoration{译} |
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JC/T 2600-2021 建筑装饰用弹性地板试验方法(中英文版) Test methods for resilient floors for building decoration{译} |
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GB/T 39145-2020 硅片表面金属元素含量的测定 电感耦合等离子体质谱法(中英文版) Test method for the content of surface metal elements on silicon wafers—Inductively coupled plasma mass spectrometry |
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GB/T 38976-2020 硅材料中氧含量的测试 惰性气体熔融红外法(中英文版) Test method for the oxygen concentration in silicon materials—Inert gas fusion infrared detection method |
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YY/T 0681.16—2019 无菌医疗器械包装试验方法 第16部分:包装系统气候应变能力试验(中英文版) Test methods for packaging of sterile medical devices - Part 16: Test for climatic resilience of packaging systems |
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GB/T 12442-2019 石英玻璃中羟基含量检验方法(中英文版) Test method for the hydroxyl groups content of silica glass |
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GB/T 37385-2019 硅中氯离子含量的测定 离子色谱法(中英文版) Test method for chloride content of silicon—Ion chromatography method |
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